Technique for the study of surface roughness of thin films: K. Truszkowska and M Jose-Yacaman, Appl Optics, 21 (34) 1982, 4465–4467

• Book ID: 103466790
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 140 KB
• Volume: 35
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(85)90419-1