✦ LIBER ✦
TCE oxidation for the elimination of oxidation-induced stacking faults in silicon: T. Hattori. Solid-St. Technol. p. 85 (November 1979)
- Publisher
- Elsevier Science
- Year
- 1980
- Tongue
- English
- Weight
- 122 KB
- Volume
- 20
- Category
- Article
- ISSN
- 0026-2714
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