✦ LIBER ✦

TCAD modeling of single MeV ion induced charge collection processes in Si devices

✍ Scribed by Jamie Stuart Laird; Toshio Hirao; Shinobu Onoda; Hidenobu Mori; Hisayoshi Itoh

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

TCAD modeling of ion beam induced charge

✍ Sean M Hearne; David N Jamieson; Changyi Yang; Andrew S Dzurak 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 208 KB

Comparison of the ion induced charge col

✍ Toshio Hirao; Hidenobu Mori; Jamie Stuart Laird; Shinobu Onoda; Hisayoshi Itoh 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 190 KB

Modeling of transient charge collection

✍ Hidenobu Mori; Toshio Hirao; Jamie Stuart Laird; Shinobu Onoda; Takeshi Wakasa; 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 175 KB

Ion beam induced charge and numerical mo

✍ T. Hopf; D.N. Jamieson; S.M. Hearne; C. Yang; C.I. Pakes; A.S. Dzurak; E. Gauja; 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 136 KB

Observation of single-ion induced charge

✍ Tomihiro Kamiya; Masakazu Oikawa; Takeshi Ohshima; Toshio Hirao; Kin Kiong Lee; 📂 Article 📅 2003 🏛 Elsevier Science 🌐 English ⚖ 117 KB

Single and multiple ionization of C_{60}

✍ Kelkar, A.; Kadhane, U.; Misra, D.; Gulyas, L.; Tribedi, L. 📂 Article 📅 2010 🏛 The American Physical Society 🌐 English ⚖ 525 KB