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Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films

✍ Scribed by Manoj Kumar, Anjana Bagga, S Neeleshwar


Book ID
119905857
Publisher
Springer-Verlag
Year
2012
Tongue
English
Weight
289 KB
Volume
7
Category
Article
ISSN
1931-7573

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