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System memory effects in the sizing of stand-alone PV systems

โœ Scribed by Aikaterini Fragaki; Tom Markvart


Book ID
112174770
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
625 KB
Volume
aop
Category
Article
ISSN
1062-7995

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โœ M. Egido; E. Lorenzo ๐Ÿ“‚ Article ๐Ÿ“… 1992 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 804 KB

The reliability of stand alone photovoltaic systems is analyzed in terms of the loss of load probability, LLP. A variety of numerical and analytic models for calculating the LLP are described and evaluated using data for three Spanish locations: Madrid, Murcia and Santander, selected because they re