Syndrome and transition count are uncorrelated [logic circuit testing]

✍ Scribed by Saxena, N.R.; Robinson, J.P.

• Book ID: 114539831
• Publisher: IEEE
• Year: 1988
• Tongue: English
• Weight: 454 KB
• Volume: 34
• Category: Article
• ISSN: 0018-9448
• DOI: 10.1109/18.2602