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Synchrotron x-ray photoelectron spectroscopy study on thermally grown SiO2/4H-SiC(0001) interface and its correlation with electrical properties

✍ Scribed by Watanabe, Heiji; Hosoi, Takuji; Kirino, Takashi; Kagei, Yusuke; Uenishi, Yusuke; Chanthaphan, Atthawut; Yoshigoe, Akitaka; Teraoka, Yuden; Shimura, Takayoshi


Book ID
118173406
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
952 KB
Volume
99
Category
Article
ISSN
0003-6951

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