✦ LIBER ✦
Synchrotron x-ray photoelectron spectroscopy study on thermally grown SiO2/4H-SiC(0001) interface and its correlation with electrical properties
✍ Scribed by Watanabe, Heiji; Hosoi, Takuji; Kirino, Takashi; Kagei, Yusuke; Uenishi, Yusuke; Chanthaphan, Atthawut; Yoshigoe, Akitaka; Teraoka, Yuden; Shimura, Takayoshi
- Book ID
- 118173406
- Publisher
- American Institute of Physics
- Year
- 2011
- Tongue
- English
- Weight
- 952 KB
- Volume
- 99
- Category
- Article
- ISSN
- 0003-6951
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