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Synchrotron X-ray diffractometry and imaging of strains and defects in icosahedral quasicrystal grains

✍ Scribed by Gastaldi, J.; Schenk, T.; Mancini, L.; Klein, H.; Härtwig, J.; Agliozzo, S.; Baruchel, J.; de Boissieu, M.

Book ID
118237601
Publisher
Taylor and Francis Group
Year
2006
Tongue
English
Weight
354 KB
Volume
86
Category
Article
ISSN
1478-6435

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✍ Shpak, A. P. ;Molodkin, V. B. ;Olikhovskii, S. I. ;Kyslovskyy, Ye. M. ;Reshetnyk 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 339 KB

## Abstract Analytical expressions for coherent and diffuse scattering intensities with account for imperfections in all the crystals of double‐ and triple‐crystal diffractometers (DCD and TCD) have been derived from the generalized dynamical theory of X‐ray scattering in real single crystals which