✦ LIBER ✦
Synchrotron white beam x-ray topography (SWBXT) and high resolution triple axis diffraction studies on AlN layers grown on 4H- and 6H-SiC seeds
✍ Scribed by Raghothamachar, Balaji; Dudley, Michael; Dalmau, Rafael; Schlesser, Raoul; Sitar, Zlatko
- Book ID
- 118248172
- Publisher
- Cambridge University Press
- Year
- 2004
- Weight
- 489 KB
- Volume
- 831
- Category
- Article
- ISSN
- 0272-9172
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