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Synchrotron radiation lithography applied to fabrication of deep-submicrometer NMOS devices at all exposure levels

✍ Scribed by A. Yoshikawa; T. Horiuchi; K. Deguchi; M. Miyake; E. Yamamoto; Y. Sakakibara; T. Kitayama


Publisher
Elsevier Science
Year
1990
Tongue
English
Weight
360 KB
Volume
11
Category
Article
ISSN
0167-9317

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