✦ LIBER ✦
Symbolic failure analysis of complex CMOS circuits due to excessive leakage current and charge sharing
✍ Scribed by Bahar, R.I.; Hui-Yuan Song; Nepal, K.; Grodstein, J.
- Book ID
- 117907313
- Publisher
- IEEE
- Year
- 2005
- Tongue
- English
- Weight
- 586 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0278-0070
No coin nor oath required. For personal study only.