✦ LIBER ✦
Swift heavy-ion induced trap generation and mixing at Si/SiO2 interface in depletion n-MOS
✍ Scribed by N. Shinde; V.N. Bhoraskar; S.D. Dhole
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 295 KB
- Volume
- 242
- Category
- Article
- ISSN
- 0168-583X
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