SVM-based face verification with feature set of small size

✍ Scribed by Lee, Kyunghee; Chung, Yongwha; Byun, Hyeran

• Book ID: 120568299
• Publisher: The Institution of Electrical Engineers
• Year: 2002
• Tongue: English
• Weight: 254 KB
• Volume: 38
• Category: Article
• ISSN: 0013-5194
• DOI: 10.1049/el:20020591