✦ LIBER ✦
Susceptibility of semiconductor devices to thermal second breakdown : N. S. Cohn. Proc. IEEE Reliab. Phys. Symp. 90 (1974)
- Book ID
- 103272431
- Publisher
- Elsevier Science
- Year
- 1975
- Tongue
- English
- Weight
- 134 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0026-2714
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