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Susceptibility characterization of a cavity with an aperture by using slowly rotating EM fields: FDTD analysis and measurements
✍ Scribed by Murano, K.; Sanpei, T.; Fengchao Xiao; Chen Wang; Kami, Y.; Drewniak, J.L.
- Book ID
- 114624219
- Publisher
- IEEE
- Year
- 2004
- Tongue
- English
- Weight
- 891 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9375
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