Surfaces and Interfaces of Electronic Materials

✍ Scribed by Leonard J. Brillson(auth.)

• Year: 2010
• Tongue: English
• Leaves: 576
• Category: Library

✦ Synopsis

An advanced level textbook covering geometric, chemical, and electronic structure of electronic materials, and their applications to devices based on semiconductor surfaces, metal-semiconductor interfaces, and semiconductor heterojunctions.

Starting with the fundamentals of electrical measurements on semiconductor interfaces, it then describes the importance of controlling macroscopic electrical properties by atomic-scale techniques. Subsequent chapters present the wide range of surface and interface techniques available to characterize electronic, optical, chemical, and structural properties of electronic materials, including semiconductors, insulators, nanostructures, and organics. The essential physics and chemistry underlying each technique is described in sufficient depth with references to the most authoritative sources for more exhaustive discussions, while numerous examples are provided throughout to illustrate the applications of each technique.

With its general reading lists, extensive citations to the text, and problem sets appended to all chapters, this is ideal for students of electrical engineering, physics and materials science. It equally serves as a reference for physicists, material science and electrical and electronic engineers involved in surface and interface science, semiconductor processing, and device modeling and design.
This is a coproduction of Wiley and IEEE

* Free solutions manual available for lecturers at www.wiley-vch.de/supplements/

Content:
Chapter 1 Introduction (pages 1–8):
Chapter 2 Historical Background (pages 9–17):
Chapter 3 Electrical Measurements (pages 19–35):
Chapter 4 Interface States (pages 37–65):
Chapter 5 Ultrahigh Vacuum Technology (pages 67–82):
Chapter 6 Surface and Interface Analysis (pages 83–92):
Chapter 7 Photoemission Spectroscopy (pages 93–127):
Chapter 8 Photoemission with Soft X?Rays (pages 129–145):
Chapter 9 Particle–Solid Scattering (pages 147–168):
Chapter 10 Electron Energy Loss Spectroscopy (pages 169–182):
Chapter 11 Rutherford Backscattering Spectrometry (pages 183–196):
Chapter 12 Secondary Ion Mass Spectrometry (pages 197–212):
Chapter 13 Electron Diffraction (pages 213–235):
Chapter 14 Scanning Tunneling Microscopy (pages 237–255):
Chapter 15 Optical Spectroscopies (pages 257–278):
Chapter 16 Cathodoluminescence Spectroscopy (pages 279–304):
Chapter 17 Electronic Materials' Surfaces (pages 305–326):
Chapter 18 Adsorbates on Electronic Materials' Surfaces (pages 327–363):
Chapter 19 Adsorbate–Semiconductor Sensors (pages 365–382):
Chapter 20 Semiconductor Heterojunctions (pages 383–445):
Chapter 21 Metals on Semiconductors (pages 447–522):
Chapter 22 The Future of Interfaces (pages 523–538):