✦ LIBER ✦
Surface voltage induced by electron trapping and interface charge buildup in silicon oxynitride thin films
✍ Scribed by A.J. de Castro; M. Fernández; J.L. Sacedón
- Book ID
- 118365715
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 489 KB
- Volume
- 269-270
- Category
- Article
- ISSN
- 0039-6028
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