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Surface tracer diffusion in the presence of a solid barrier: a Monte Carlo study

✍ Scribed by Andrzej Pȩkalski; Marcel Ausloos

Book ID
116067666
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
278 KB
Volume
344
Category
Article
ISSN
0039-6028

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The joint migration of vacancy-impurity-pairs (VIPs) in dilute metallic alloys has been used in a previous publication to explain void formation resistance in electromigration experiments for certain material combinations. A corresponding rule is based on the valency of matrix and alloying elements.