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Surface tension, roughening, and lower critical dimension in the random-field Ising model

✍ Scribed by Grinstein, G.; Ma, Shang-keng

Book ID: 125489556
Publisher: The American Physical Society
Year: 1983
Tongue: English
Weight: 803 KB
Volume: 28
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.28.2588

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