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Surface tension and contact angle of molten semiconductor compounds: I. cadmium telluride

✍ Scribed by Rajaram Shetty; Raghuraman Balasubramanian; William R. Wilcox

Book ID: 107790497
Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 491 KB
Volume: 100
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(90)90606-l

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## Abstract A survey is given of the existing methods for measuring the surface tension from the geometry of sessile drops. These methods, which generally consist of the measurement of simple drop dimensions, are insufficiently accurate for use with adsorption studies. A new procedure is described