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Surface structure of epitaxial NiSi2 grown on Si(001) determined by low energy ion scattering techniques

โœ Scribed by Judy H. Huang; Richard S. Daley; David K. Shuh; R.Stanley Williams


Publisher
Elsevier Science
Year
1987
Weight
70 KB
Volume
186
Category
Article
ISSN
0167-2584

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