Surface state characterization at the oxide-silicon and nitroxide-silicon interfaces : G. Soncini, G. B. Tripodi, M. Zen and N. Zorzi. Microelectron. J.21(1), 23 (1990)

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 120 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90361-p