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Surface sensitivity of SiON integrated optical waveguides (IOWs) examined by IOW-attenuated total reflection spectrometry and IOW-Raman spectroscopy

✍ Scribed by T.E. Plowman; M.D. Garrison; D.S. Walker; W.M. Reichert


Book ID
107864134
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
538 KB
Volume
243
Category
Article
ISSN
0040-6090

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