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Surface roughness and surface-induced resistivity of gold films on mica: Application of quantitative scanning tunneling microscopy

✍ Scribed by Munoz, Raúl; Vidal, Guillermo; Mulsow, Marcelo; Lisoni, Judit; Arenas, Claudio; Concha, Andres; Mora, Fernando; Espejo, Roberto; Kremer, Germán; Moraga, Luis; Esparza, Rolando; Haberle, Patricio

Book ID
121444680
Publisher
The American Physical Society
Year
2000
Tongue
English
Weight
162 KB
Volume
62
Category
Article
ISSN
1098-0121

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A central question regarding thin metallic films is how does the roughness of the film affect its electrical transport properties, when its thickness is comparable to or smaller than the electron mean free path. The drive to build ever-faster circuits generates the drive for miniaturization and VLSI