✦ LIBER ✦
Surface roughening at the ZnTe/GaAs interface in stationary and sample rotation SIMS depth profiling
✍ Scribed by P Konarski; M Hautala
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 577 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0042-207X
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