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Surface reflectance spectroscopy: Its application to the study of very thin films

✍ Scribed by Y. Borensztein; F. Abelès

Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 954 KB
Volume: 125
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(85)90406-7

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