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Surface recombination probabilities of H on stainless steel, a-Si:H and oxidized silicon determined by threshold ionization mass spectrometry in H2 RF discharges
✍ Scribed by Patrick Kae-Nune; Jérôme Perrin; Jacques Jolly; Jean Guillon
- Book ID
- 116068741
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 278 KB
- Volume
- 360
- Category
- Article
- ISSN
- 0039-6028
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