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Surface processes on Si(1 1 1)7×7 and SiO2 mediated by low-energy ion irradiation in CF4

✍ Scribed by Zhenhua He; K.T Leung


Book ID
108417432
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
136 KB
Volume
174
Category
Article
ISSN
0169-4332

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Charge-changing cross-sections u43, u42 and u4, of C4+ injected into CH, , C2H,, C,H, and n-C4H,, were measured in the energy range 0.7-400 eV u-'. A tandem mass spectrometer system with an ion source of the EBIS type (Mini-EBIS) and a collision cell consisting of an octupole ion beam guide was used