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Surface plasmon microscopy with an electron angular scanning

โœ Scribed by Takayuki Okamoto


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
129 KB
Volume
24
Category
Article
ISSN
0030-3992

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Analytical scanning electron microscopy
โœ Ichinokawa, T. ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 946 KB

A scanning electron microscope of ultra-high-vacuum (UHV-SEM) with a field emission gun (FEG) is operated at the primary electron energies of from 100 eV to 3 keV. The instrument can form the images that contain information on surface chemical composition, chemical bonding state (electronic structur