Surface modification of Sylgard 184 polydimethylsiloxane by 254 nm excimer radiation and characterization by contact angle goniometry, infrared spectroscopy, atomic force and scanning electron microscopy

✍ Scribed by Emanuel A. Waddell; Stephen Shreeves; Holly Carrell; Christopher Perry; Branden A. Reid; James McKee

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 502 KB
• Volume: 254
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2008.02.087