Surface microwave conductivity spectroscopy. A new experimental tool

✍ Scribed by M. Kunst; H. Tributsch

• Book ID: 103027323
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 314 KB
• Volume: 105
• Category: Article
• ISSN: 0009-2614
• DOI: 10.1016/0009-2614(84)85634-1

✦ Synopsis

Microwave conductivity mexuremenls alone do not lend themselves easily for surface srudies of semiconductins mat* rials since they mainly reflect bulk properties In combination with a surface modulation. howcvLr_ such as a pcriodlc electrical potential change or light-induced electron excitation they become a sensitive and useful technique of surface imestigxtions. This conclusion is supported by microwave conductlvlty studies (S-40 GHz in the discussed experiments) performed at semiconductor/liquid. semlconductor/metl and semiconductor/gas interfaces. Since surface microxra%z conductivity measurements respond to changes in the conccntrabon of charge carriers and in the conrrntration of dipoles the> are especially interesnng for electrochenxal. photoelectrochemical and photovoltaic studies as ~cll as for catalytical research Similar quantities can be measured as with conventional electrochemical techniques. however without RC constants of external circuits, resulting in a time resolurion of 0.3 ns flimited XII present by oscilloscope)-The sensitlvit: p.~rm~ts the detcction of lOa charge carriers