Surface Microscopy with Low Energy Electrons

✍ Scribed by Ernst Bauer (auth.)

• Publisher: Springer-Verlag New York
• Year: 2014
• Tongue: English
• Leaves: 513
• Edition: 1
• Category: Library

✦ Synopsis

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.

✦ Table of Contents

Front Matter....Pages i-xix
Introduction: History....Pages 1-19
Basic Interactions....Pages 21-88
Instrumentation....Pages 89-188
Theory of Image Formation....Pages 189-228
Applications in Surface Science....Pages 229-345
Applications in Other Fields....Pages 347-408
Magnetic Imaging....Pages 409-464
Other Surface Imaging Methods with Electrons....Pages 465-477
Back Matter....Pages 479-496

✦ Subjects

Characterization and Evaluation of Materials; Spectroscopy/Spectrometry; Solid State Physics; Spectroscopy and Microscopy; Surfaces and Interfaces, Thin Films; Biological Microscopy