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Surface leakage current analysis of ion implanted ZnS-passivated n-on-p HgCdTe diodes in weak inversion

✍ Scribed by Young-Ho Kim; Soo-Ho Bae; Hee Chul Lee; Choong Ki Kim


Book ID
107452572
Publisher
Springer US
Year
2000
Tongue
English
Weight
421 KB
Volume
29
Category
Article
ISSN
0361-5235

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