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Surface layer impurities on silicon spheres used in determination of the Avogadro constant

✍ Scribed by Kenny, M.J.; Netterfield, R.P.; Wielunski, L.S.; Beaglehole, D.


Book ID
114544274
Publisher
IEEE
Year
1999
Tongue
English
Weight
109 KB
Volume
48
Category
Article
ISSN
0018-9456

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