Surface Geometric Structure of Chemically Modified Silica Studied by Direct Atomic Force Microscopy (AFM) Imaging and Adsorption Method

✍ Scribed by Fuji, Masayoshi; Machida, Kotoe; Takei, Takashi; Watanabe, Tohru; Chikazawa, Masatoshi

• Book ID: 126159599
• Publisher: American Chemical Society
• Year: 2000
• Tongue: English
• Weight: 384 KB
• Volume: 16
• Category: Article
• ISSN: 0743-7463
• DOI: 10.1021/la991134x