Determining Surface Potential of the Bit
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Jaroslaw Drelich; Jun Long; Anthony Yeung
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Article
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2008
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John Wiley and Sons
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English
⚖ 768 KB
## Abstract Atomic force microscopy (AFM) was used to measure the surface forces between a silicon nitride AFM tip and a deposited layer of Athabasca bitumen; the measurements were carried out in pure water (pH 6.0–6.5) and 1 mM KCl solution (pH 9). An AFM pyramidal‐shaped tip was moved stepwise us