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Surface electromigration of Au-Ag binary film on SiO2

โœ Scribed by F. X. Shi; W. Q. Yao; L. L. Cao; Y. H. Dong

Book ID
110672923
Publisher
Springer
Year
1997
Tongue
English
Weight
323 KB
Volume
16
Category
Article
ISSN
0261-8028

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The purpose of this work was to study surface diffusion of atoms in Au-Ag films deposited on SiO 2 substrate under the action of a d.c. field, focusing on the effect of chemical reaction at the Au-Ag/SiO 2 interface on the electromigration behaviour. Atomic force microscopy measurement depicted the