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Surface Double Layer on (001) Surfaces of Alkali Halide Crystals: A Scanning Force Microscopy Study

โœ Scribed by Barth, Clemens; Henry, Claude R.

Book ID
121337231
Publisher
The American Physical Society
Year
2007
Tongue
English
Weight
897 KB
Volume
98
Category
Article
ISSN
0031-9007

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Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane