Surface depth analysis for fluorinated block copolymer films by X-ray photoelectron spectroscopy using C60 cluster ion beam

✍ Scribed by Keiji Tanaka; Noriaki Sanada; Masaya Hikita; Tetsuya Nakamura; Tisato Kajiyama; Atsushi Takahara

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 339 KB
• Volume: 254
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2008.02.089