✦ LIBER ✦
Surface damage induced by focused-ion-beam milling in a Si/Si p–n junction cross-sectional specimen
✍ Scribed by Zhouguang Wang; Takeharu Kato; Tsukasa Hirayama; Naoko Kato; Katsuhiro Sasaki; Hiroyasu Saka
- Book ID
- 103816280
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 314 KB
- Volume
- 241
- Category
- Article
- ISSN
- 0169-4332
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