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Surface Current Determination from Electric-Fields Distribution Measurement

โœ Scribed by Hsu, Hwei-Piao

Book ID
114627909
Publisher
IEEE
Year
1963
Tongue
English
Weight
841 KB
Volume
12
Category
Article
ISSN
0018-9456

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The current J and magnetic field H distributions in a thin film have been calculated for arbitrary changes of the external field (He). A joint solution of equations describing the field and current distributions in three different states (Meiuner, critical and mixed) taking into account a tangential