Surface chemical analysis of avcothane and biomer by Fourier transform IR internal reflection spectroscopy

✍ Scribed by Sung, C. S. Paik ;Hu, C. B. ;Merrill, E. W. ;Salzman, E. W.

• Publisher: John Wiley and Sons
• Year: 1978
• Tongue: English
• Weight: 582 KB
• Volume: 12
• Category: Article
• ISSN: 0021-9304
• DOI: 10.1002/jbm.820120603

✦ Synopsis

Abstract

During the solvent casting process, one side of the polymer film is exposed to air while the other side is in contact with a substrate, used as a mold. We have studied the effect of this difference in exposure during casting on the chemical composition of two types of segmented polyurethane,^5^ BiomerBiomert™, Ethicon Corp., Somerville, N.J.

and Avcothane,Avcothanetm™, Avco‐Everett Co., Everett, Mass.

by using Fourier transform IR internal reflection spectroscopy. Also, a depth‐composition profile was obtained by placing a thin barrier film between the reflection plate and the polymer film.

In Avcothane, the air side, which is the blood‐contact side, contains a greater amount of the soft segment than the substrate side, and this is more pronounced in the layer closer to the surface. The anisotropy in composition is more drastic when the silicone content is compared. In a layer about 1.5 μ thick, one can detect a greater amount of silicone in the substrate side than in the air side. However, when one averages the concentration in a layer of about 0.8 μ, the trend is reversed; i.e., the greater amount of silicone is now present in the air side than in the substrate side. In Biomer films, the anisotropy in chemical composition is less pronounced. Only a modest increase in the relative content of the soft segment/hard segment is observed in the air side when a depth‐composition profile is obtained.