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Surface characterization of atomic oxygen beam-exposed polyimide films using contact angle measurements

✍ Scribed by K. Gotoh; M. Tagawa; N. Ohmae; H. Kinoshita; M. Tagawa

Book ID: 106069731
Publisher: Springer
Year: 2001
Weight: 130 KB
Volume: 279
Category: Article
ISSN: 0340-255X
DOI: 10.1007/s003960000414

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