Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) || Field Ion Microscopy (FIM) and Atom Probe (AP)

✍ Scribed by Friedbacher, Gernot; Bubert, Henning

• Book ID: 121750495
• Publisher: Wiley-VCH Verlag GmbH & Co. KGaA
• Year: 2011
• Tongue: German
• Weight: 544 KB
• Edition: 2
• Category: Article
• ISBN: 3527320474
• DOI: 10.1002/9783527636921.ch15