Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) || Electron-Impact (EI) Secondary Neutral Mass Spectrometry (SNMS)

✍ Scribed by Friedbacher, Gernot; Bubert, Henning

• Book ID: 121706514
• Publisher: Wiley-VCH Verlag GmbH & Co. KGaA
• Year: 2011
• Tongue: German
• Weight: 287 KB
• Edition: 2
• Category: Article
• ISBN: 3527320474
• DOI: 10.1002/9783527636921.ch9