Surface and Thin Film Analysis

✍ Scribed by Gernot Friedbacher, Henning Bubert

• Publisher: Wiley
• Year: 2011
• Tongue: English
• Leaves: 559
• Edition: 2
• Category: Library

✦ Synopsis

Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.From a Review of the First Edition (edited by Bubert and Jenett)"... a useful resource..."(Journal of the American Chemical Society)