Surface and interface characterization of high Tc related epitaxial films by STM/STS and XPS

✍ Scribed by H. Koinuma; S. Gonda; J.P. Gong; M. Kawasaki; M. Yoshimoto; M. Nantoh; T. Hasegawa; K. Kitazawa

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 588 KB
• Volume: 54
• Category: Article
• ISSN: 0022-3697
• DOI: 10.1016/0022-3697(93)90170-v