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Surface analyses of Zr (film)/4H-SiC (substrate) by synchrotron radiation induced-PEEM

✍ Scribed by C. Kamezawa; M. Hirai; M. Kusaka; M. Iwami; J. Labis


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
206 KB
Volume
237
Category
Article
ISSN
0169-4332

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