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Surf. Interface Anal. 27, 600-606 (1999), ?Quantitative Material Characterization by Ultrasonic AFM?, by K. Yamanaka, A. Noguchi, T. Tsuji and T. Goto.

✍ Scribed by Lisowski, W.; van den Berg, A. H. J.; Leonard, D.; Mathieu, H. J.

Publisher: John Wiley and Sons
Year: 2000
Tongue: English
Weight: 15 KB
Volume: 29
Category: Article
ISSN: 0142-2421
DOI: 10.1002/(sici)1096-9918(200004)29:4<298::aid-sia875>3.0.co;2-x

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✍ Yamanaka, K.; Noguchi, A.; Tsuji, T.; Koike, T.; Goto, T. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 179 KB

In an atomic force microscope equipped with a micromachined cantilever tip, the cantilever vibration spectra in contact with the sample were found to be strongly dependent on the excitation power. However, if the excitation power is small enough, the resonance peak width decreases and the peak frequ