Supression of drain conductance transients, drain current oscillations, and low-frequency generation—Recombination noise in GaAs FET's using buried channels

✍ Scribed by Canfield, P.; Forbes, L.

• Book ID: 114595605
• Publisher: IEEE
• Year: 1986
• Tongue: English
• Weight: 453 KB
• Volume: 33
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1986.22596